The Microscopy Society of America (MSA) Distinguished Scientist Award is presented to a preeminent senior scientist with a longstanding record of achievement during their career in the field of microscopy or microanalysis. Philip E. Batson received his Applied Physics Ph.D. in 1976 from Cornell University and performed postdoctoral work at the Cavendish Laboratory in Cambridge, England. He moved to the IBM Thomas J. Watson Research Center from 1978-2009. Here, during the 1980s, Batson built high resolution electron energy loss spectroscopy (EELS) equipment and used it to research spatially resolved EELS (SR-EELS) in the scanning transmission electron microscope, with studies of surface plasmon scattering in metal nanoparticle systems. In 2002, he was the first to demonstrate sub-Angstrom imaging using aberration correction, for which he was recognized with a 2002-2003 Scientific American Award for Leadership in Imaging Sciences. Currently, Batson is a distinguished research professor at Rutgers University with appointments in Physics and Materials Science. He is exploring phonon behavior in nanometer-sized structures using EELS with a 10 meV energy resolution. The NSF-sponsored project, in collaboration with Nion, to improve EELS resolution was cited in 2010 by the White House as one of “100 Recovery Act Projects that are Changing America.” He has authored over 210 publications and is an American Physical Society and Microscopy Society of America Fellow.
Below Image: Batson (right) stands with John Silcox (left) at the Microscopy & Microanalysis 2019 Meeting. Silcox was both undergraduate and Ph.D. advisor to Batson, their working relationship dates from the spring of 1968.
Source: www.microscopy.org and Philip Batson
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